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http://repositorio.ufla.br/jspui/handle/1/46344
Title: | Evolution of quality assessment in SPL: a systematic mapping |
Keywords: | Software maintenance Software quality Software reusability ISO standards IEC standards Linhas de Produto de Software Software - Manutenção Software - Qualidade Software - Reutilização Segurança da informação - Normas técnicas |
Issue Date: | Aug-2020 |
Publisher: | The Institution of Engineering and Technology |
Citation: | MARTINS, L. A. et al. Evolution of quality assessment in SPL: a systematic mapping. IET Software, [S. I.], v. 14, n. 6, p. 572-581, Dec. 2020. DOI: 10.1049/iet-sen.2020.0037. |
Abstract: | Software product line (SPL) is one of the most recent and effective reuse approaches. SPL derives several products from the core artefacts. SPL engineering includes two processes: domain engineering, which identifies the common and variable features to develop the core artefacts, and application engineering, which reuses the core artefacts to derive products. Once the artefacts are reused across multiple products, quality assessment is necessary to prevent inconsistencies from spreading across all SPL products. There are several frameworks and standards, as ISO/IEC 25010:2011, to evaluate quality characteristics. In this study, the authors provide an overview of the SPL quality assessment. Therefore, they perform a systematic mapping to compile and synthesise data regarding the quality characteristics assessed in studies from 2000 to 2019. The results include the identification of 346 metrics applied in 16 software properties to evaluate three quality characteristics of the ISO/IEC 25010:2011. Additionally, they find the domain engineering evaluation frequently occurs regarding the maintainability characteristic. Moreover, they provide analyses of the: (i) metrics used by programming paradigm, (ii) metrics used by software properties, (iii) software properties evaluated for each quality characteristic, (iv) tools used to extract metrics, (v) systems used as benchmarks, and (vi) datasets used for extracting metrics. |
URI: | https://digital-library.theiet.org/content/journals/10.1049/iet-sen.2020.0037 http://repositorio.ufla.br/jspui/handle/1/46344 |
Appears in Collections: | DCC - Artigos publicados em periódicos |
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